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Measurement Analysis

XRF Coating Thickness Measurement for Fasteners

XRF Coating Thickness Measurement for Fasteners

We are the leading manufacturer and supplier of Coating Thickness Measurement & Material & Analysis.

Other Details:
ModelCompact EcoCompact Eco Pin (Si-Pin)Compact Eco SDD
Measuring DirectionTop to Bottom
Applied ApplicationCoating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys
X-ray TubeMin-focus, high performance, W-target,
spot 0.2mm-0.8mm
Long Life, High efficiency tungsten target, air cooled
High Voltage50kV (1.2mA) Software Control Optimized50kV / (1.2mA) programmable
DetectorHigh resolution Gas Filled Prop CounterHigh resolution Silicon Pin DetectorSilicon Drift Detector
Measurement Time60 sec. to 180 sec.
Collimator0.3mmØ or 0.5mmØ, Optional four positions Collimator changer
Sample StageManual scissors type z-stage,
Power Supply230V AC, 50/60Hz, 120W / 100W
Inside Chamber375 mm x 350 mm x 255 mm (LxWxH)
Dimension630 mm x 430 mm x 420 mm (LxWxH)
Weight (Approx)45 kg
OptionalAuto Z stage, Joy-Stick real operational movement, point & shoot, auto-focus facility


X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry. XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet's XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

TechnologyTechnologyMajor benefits of XRF
Different energy dispersive detectors are available for measurements of XRF, such as proportional counters (PC), PINdiodes and silicon drift detectors (SDD). The physical principles of these detectors are very different. A PC uses a mixture of a noble gas with a quench gas that is ionized by an incident radiation . The electrons are accelerated in the electric field and can ionize other gas atoms resulting in an internal amplification. In this case the energy for generation of the primary signal is relatively high.

Different energy dispersive detectors are available for measurements of XRF, such as proportional counters (PC), PINdiodes and silicon drift detectors (SDD). The physical principles of these detectors are very different. A PC uses a mixture of a noble gas with a quench gas that is ionized by an incident radiati n . The electrons are accelerated in the electric field and can ionize other gas atoms resulting in an internal amplification. In this case the energy for generation of the primary signal is relatively high.

Additional Information:

Coating Measurement Thickness XRF Spectrometer For Hardware

Coating Measurement Thickness XRF Spectrometer For Hardware

X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry.

XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength.

By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

Technology:

Different Energy Dispersive Detectors are available for Measurement of XRF, such as proportional counter (PC), PIN Diodes and silicon drift detectors( SDD).

The physical principle of these detectors are very different. A PC uses a mixture of a Noble gas with a quench gas that is ionized by an incident radiation.

The electrons are accelerated in the electric field and can ionized by other gas atoms resulting in an international amplification. In this case the energy for generation of the primary signal is relatively high.
In solid state detector (PIN,SDD),the incident radiation generates charge carriers which are collected by an electric field.

The energy to generate the primary signal is significantly lower than for a PC. that is higher the number of primary charge carriers can be generated. This reduces the statistical error and improves the energy resolution.

Proportional Counter Detector Gas filled proportional counter has distinct advantages like high efficiency wide bandwidth larger area Where it can be scaled to arbitrarily large size.

Major benefits of XRF

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as jewellery, metals and mining, construction materials and chemicals.

Aczet’s XRF product helps customers to improve product quality and performance, increase productivity, yield and reduce downtime and waste.

The entire operation, the evaluation of the measurement as well as the clear presentation of the measurement data is done on a pc using the powerful and User-friendly Xmaster software.

Features of XMasteR Application

Calibration

• Pre-calibrated for Gold and other precious metals.



PMI Analysis Portable XRF Spectrometer

PMI Analysis Portable XRF Spectrometer
  • PMI Analysis Portable XRF Spectrometer
  • PMI Analysis Portable XRF Spectrometer
  • PMI Analysis Portable XRF Spectrometer

 Technology

Nanoris is based on Si-PIN/SDD technology for measuring alloys including precious metals.

Calibration

Pre-calibrated for major alloys and precious metals with elements range from Mg and U.

Ease

Non-destructive testing with one touch operation within few seconds. User friendly & easy to operate doesn’t  require special person to operate

Compact

Small, light With 1.6kg , weight is very easy to carry & test

Excellent Performance

High-speed processing chip, advanced algorithm and high-responsive software, resulting in even faster analysis.

High-performance X-ray Tube, Ultrahigh Resolution Detector combined with Digital Multi-channel Processing  Technology, yielding super-high detection resolution.

Industrial resistive touch screen, superior to capacitor screen in back-light and clearer against sunlight in the field.

Data Processing

With built in 32GB memory, USB, Bluetooth, data can be exported to EXCEL or PDF formats. Users can customize the reports by adding their company logos, addresses, test results spectrum and others (such as product description, origin and batch number).

Software

Nanoris software is a professional FP based software which enables the users  to easily configure passwords, customize analysis reports

Safety

Built-in double beam technology can automatically sense whether there is a sample at the measurement window to avoid any damage. Provided with standard Waterproof, dust-proof and shockproof suitcase & Safety Band for safely use of machine.

Power supply system

Intelligent battery management through MSBUS bus , real – time monitoring of the residual capacity of battery and backup battery. A single battery can last upto 8 hours*.
Performance Features

1. Non destructive testing (NDT) Nanoris test does not damage o have any adverse effect on the use of samples. No damage is foresee in the entire test process.

2. High-performance X-ray Tube, Ultrahigh Resolution Detector combined with Digital Multi-channel Processing Technology, yielding super-high detection resolution.

3. Resistive Industrial 4.3" touch screen, superior to capacitor screen in backlight and clearer against sunlight in the field. It automatically adjusts display brightness according to the environment brightness.

5. Automatic switch to standby mode when not used and recovery after the machine is picked up, which saves power and extends working time; machine also give out alarm when ambient temperature or humidity exceeds the scope of application.

6. Aczet Ultra-short optical path design can significantly improve light element excitation effects, without the fall/fill condition.

Application Range

Nondestructive, rapid and accurate analysis for:

1. Alloy elements and alloy grade identification on the site.

2. Metal identification / scrap metal sorting.

3. Q A / Q C management in the production of metal processing and manufacturing, etc.

4. Accurate element analysis of raw material and PMI identification so as to meet production needs and ensure security of equipment and materials used in the process.

Coating Measurement Thickness XRF Spectrometer for Connector

Coating Measurement Thickness XRF Spectrometer for Connector

X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry.

XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials andis mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

Technology:

Different Energy Dispersive Detectors are available for Measurement of XRF, such as proportional counter (PC), PIN Diodes and silicon drift detectors( SDD).

The physical principle of these detectors are very different. A PC uses a mixture of a Noble gas with a quench gas that is ionized by an incident radiation.

The electrons are accelerated in the electric field and can ionized by other gas atoms resulting in an international amplification. In this case the energy for generation of the primary signal is relatively high.

In solid state detector (PIN,SDD), the incident radiation generates charge carriers which are collected by an electric field.

The energy to generate the primary signal is significantly lower than for a PC. that is higher the number of primary charge carriers can be generated. This reduces the statistical error and improves the energy resolution.

Major benefits of XRF

• Versatile testing equipments, potentially solving multiple testing need swith one analyzer.

• Low initial costs compared to other analytical equipment

• Minimum operation costs

• Non-destructive solutions

• Minimal sample preparation

• Instant results 60 to 300 sec.

• Relatively simple technology to learn & obtain accurate, repeatable results.

• Maximum profits through accuracy

• Increase turn around and production output

• In-house quality control

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control formanufacturing processes in industries such as jewellery, metals and mining, construction materials and chemicals.

Aczet’s XRF product helps customers to improve product quality and performance, increase productivity, yield and reduce downtime and waste.

The entire operation, the evaluation of the measurement as well as the clear presentation of the measurement data is done on a pc using the powerful and User-friendly Xmaster software.

Features of XMasteR Application

Calibration

• Pre-calibrated for Gold and other precious metals.

Material Analysis Portable XRF Spectrometer

Material Analysis Portable XRF Spectrometer

Technology
Nanoris is based on Si-PIN/SDD technology for measuring alloys including precious metals.

Calibration

Pre-calibrated for major alloys and precious metals with elements range from Mg and U.

Ease

Non-destructive testing with one touch operation within few seconds. User friendly & easy to operate doesn’t require special person to operate.

Compact

Small, light With 1.6kg , weight is very easy to carry & test

Excellent Performance

High-speed processing chip, advanced algorithm and high-responsive software, resulting in even faster analysis.

High-performance X-ray Tube, Ultrahigh Resolution Detector combined with Digital Multi-channel Processing Technology, yielding super-high detection resolution.

Industrial resistive touch screen, superior to capacitor screen in back-light and clearer against sunlight in the field.

Data Processing

With built in 32GB memory, USB, Bluetooth, data can be exported to EXCEL or PDF formats. Users can customize the reports by adding their company logos, addresses, test results, spectrum and others (such as product description, origin and batch number).

Software

Nanoris software is a professional FP based software which enables the user to easily configure passwords, customize analysis reports

Safety

Built-in double beam technology can automatically sense whether there is sample at the measurement window to avoid any damage. Provided wit standard Waterproof, dust-proof and shockproof suitcase & Safety Band fo safely use of machine.

Power supply system

Intelligent battery management through MSBUS bus , real – time monitoring of the residual capacity of battery and backup battery. A single battery can last upto 8 hours*.

Performance Features

1. Non destructive testing (NDT) Nanoris test does not damage o have any adverse effect on the use of samples. No damage is foresee in the entire test process.

2. High-performance X-ray Tube, Ultrahigh Resolution Detector combine with Digital Multi-channel Processing Technology, yielding super-hig detection resolution.

3. Resistive Industrial 4.3" touch screen, superior to capacitor screen in backligh and clearer against sunlight in the field. It automatically adjust display brightness according to the environment brightness.

5. Automatic switch to standby mode when not used and recovery afterthe machine is picked up, which saves power and extends workin time; machine also give out alarm when ambient temperature o humidity exceeds the scope of application.

6. Aczet Ultra-short optical path design can significantly improv light element excitation effects, without the fall/fill condition.

Application Range

Nondestructive, rapid and accurate analysis for:

1. Alloy elements and alloy grade identification on the site.

2. Metal identification / scrap metal sorting.

3. Q A / Q C management in the production of metal, processing an manufacturing, etc.

4. Accurate element analysis of raw material and PMI identification so a to meet production needs and ensure security of equipment an materials used in the process.

 

XRF Coating Thickness Measurement for Printed Circuit Board

XRF Coating Thickness Measurement for Printed Circuit Board

X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry.

XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength.By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

Technology:

Different Energy Dispersive Detectors are available for Measurement of XRF, such as proportional counter (PC), PIN Diodes and silicon drift detectors( SDD).

The physical principle of these detectors are very different. A PC uses a mixture of a Noble gas with a quench gas that is ionized by an incident radiation.

The electrons are accelerated in the electric field and can ionized by other gas atoms resulting in an international amplification. In this case the energy for generation of the primary signal is relatively high.

In solid state detector (PIN,SDD), the incident radiation generates charge carriers which are collected by an electric field.

The energy to generate the primary signal is significantly lower than for a PC. that is higher the number of primary charge carriers can be generated. This reduces the statistical error and improves the energy resolution.


Major benefits of XRF

 

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as jewellery, metals and mining, construction materials and chemicals.

Aczet’s XRF product helps customers to improve product quality and performance, increase productivity, yield and reduce downtime and waste.

The entire operation, the evaluation of the measurement as well as the clear presentation of the measurement data is done on a pc using the powerful and User-friendly Xmaster software.

Features of XMasteR Application

 

Calibration

• Pre-calibrated for Gold and other precious metals.


Additional Information:

Coating Thickness Measurement & Material & Analysis (Axiom)

Coating Thickness Measurement & Material & Analysis (Axiom)
High energy photons emitted by a X-ray tube interact with metal & materials. The high energy photon is absorbed by an electron of the atom. This electron is accelerated and forced to leave the atom. The so created hole in the structure of the electron shell is filled up by an electron of higher energy. The difference is energy between the leaving electrons position and the filling up electron may leave the atom as a photon of defined energy or as an electron. In the case of a leaving photon this process is called X-ray fluorescent and the energy of the leaving photon is characteristic for this atom therefore for the element. The electron shells of an atom are called K-, L-, M-shell. 
Filling up a hole in the K-Shell creates, K-radiation (Ka if the filling up electron has is origin in the L-shell, Ka if the filling up electron has is origin in the M-shell). Filling up a hole in the L-shell creates L-radiation and so on. Only K and L radiation is on interest because the energy of K and L radiation is in the region which can be detected with standard detectors.
Axiom are XRF are the user friendly bench top instruments designed for material analysis and coating thickness measurements. The Xray source and detector assembly is located in the instruments upper chamber with motorizes Z axis movement which ensures the ease of measurement. The integrated video microscope with zoom and crosshair simplifies samples placement and allows for a precise measuring spot adjustment.
The instruments are perfectly designed to cater to material analysis and coating thickness measurement of multiple layers in application as follows:
  • Electronic and Electrical components
  • jewellery
  • Fastness
  • PCB
  • Liquid Analysis
  • Hardware
  • Connectors
AxiomHighly Professional automated user-friendly instrument for coating thickness measurement & material analysis

Specifications:

X-Ray Tube:
High Performing, stable with long life tungsten tube.
Spot size approx. 0.5x0.5mm to assure minimal beam spread.

High Voltage:
50kV, 1.2mA (60 Watt) high voltage generator, software controlled.

Collimator:
Single Collimator 0.3mmØ (optional sizes: 0.1mm, 0.2mm, 0.5mm, 0.7mm)
Detector:
Proportional Counter Si-Pin & SDD.

Colour Video microscope:
High-resolution CCD color camera for optical monitoring of the measurement location with 20X zoom. Electronic cross hair with scale and beam size indication.
Software:
User Friendly, coating-thickness analysis and operating programms.
Results ans static data can be stored in a data file.

There are three seperate modules as follows:
1. Evaluation module for coating thickness and composition analysis.
2. Software Module for fast and simple qualitative analysis. Up to 20 elements can be identified simultaneously.
3. To generate thickness applications without standards using the Fundamental Parameter calculation method.
Sample Focus:
Motorised moving head z axis.
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Purpose of Requirement:

Reselling End Use Raw Material

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    Aczet

    Aczet Private Limited

    Andheri East, Mumbai, Maharashtra, India

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