Aczet Private Limited Mumbai, Maharashtra

Measurement Analysis

XRF Coating Thickness Measurement for Fasteners

XRF Coating Thickness Measurement for Fasteners

We are the leading manufacturer and supplier of Coating Thickness Measurement & Material & Analysis.

Other Details:
ModelCompact EcoCompact Eco Pin (Si-Pin)Compact Eco SDD
Measuring DirectionTop to Bottom
Applied ApplicationCoating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys
X-ray TubeMin-focus, high performance, W-target,
spot 0.2mm-0.8mm
Long Life, High efficiency tungsten target, air cooled
High Voltage50kV (1.2mA) Software Control Optimized50kV / (1.2mA) programmable
DetectorHigh resolution Gas Filled Prop CounterHigh resolution Silicon Pin DetectorSilicon Drift Detector
Measurement Time60 sec. to 180 sec.
Collimator0.3mmØ or 0.5mmØ, Optional four positions Collimator changer
Sample StageManual scissors type z-stage,
Power Supply230V AC, 50/60Hz, 120W / 100W
Inside Chamber375 mm x 350 mm x 255 mm (LxWxH)
Dimension630 mm x 430 mm x 420 mm (LxWxH)
Weight (Approx)45 kg
OptionalAuto Z stage, Joy-Stick real operational movement, point & shoot, auto-focus facility


X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry. XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet's XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

TechnologyTechnologyMajor benefits of XRF
Different energy dispersive detectors are available for measurements of XRF, such as proportional counters (PC), PINdiodes and silicon drift detectors (SDD). The physical principles of these detectors are very different. A PC uses a mixture of a noble gas with a quench gas that is ionized by an incident radiation . The electrons are accelerated in the electric field and can ionize other gas atoms resulting in an internal amplification. In this case the energy for generation of the primary signal is relatively high.

Different energy dispersive detectors are available for measurements of XRF, such as proportional counters (PC), PINdiodes and silicon drift detectors (SDD). The physical principles of these detectors are very different. A PC uses a mixture of a noble gas with a quench gas that is ionized by an incident radiati n . The electrons are accelerated in the electric field and can ionize other gas atoms resulting in an internal amplification. In this case the energy for generation of the primary signal is relatively high.

Additional Information:

Coating Thickness Measurement & Material & Analysis (Axiom)

Coating Thickness Measurement & Material & Analysis (Axiom)

XRF Coating Thickness Measurement for Printed Circuit Board

XRF Coating Thickness Measurement for Printed Circuit Board

X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry.

XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength.By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated.

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as Jewellery, Metals and Mining, Construction materials and Chemicals.

Technology:

Different Energy Dispersive Detectors are available for Measurement of XRF, such as proportional counter (PC), PIN Diodes and silicon drift detectors( SDD).

The physical principle of these detectors are very different. A PC uses a mixture of a Noble gas with a quench gas that is ionized by an incident radiation.

The electrons are accelerated in the electric field and can ionized by other gas atoms resulting in an international amplification. In this case the energy for generation of the primary signal is relatively high.

In solid state detector (PIN,SDD), the incident radiation generates charge carriers which are collected by an electric field.

The energy to generate the primary signal is significantly lower than for a PC. that is higher the number of primary charge carriers can be generated. This reduces the statistical error and improves the energy resolution.


Major benefits of XRF

 

Aczet’s XRF product is based on a German technology, used to measure the composition and purity of materials and is mainly applied in industrial quality control and in process control for manufacturing processes in industries such as jewellery, metals and mining, construction materials and chemicals.

Aczet’s XRF product helps customers to improve product quality and performance, increase productivity, yield and reduce downtime and waste.

The entire operation, the evaluation of the measurement as well as the clear presentation of the measurement data is done on a pc using the powerful and User-friendly Xmaster software.

Features of XMasteR Application

 

Calibration

• Pre-calibrated for Gold and other precious metals.


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Reselling End Use Raw Material

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    Aczet Private Limited

    Andheri East, Mumbai, Maharashtra, India

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